The Electronic System Design Alliance
and
The IEEE Council on EDA (CEDA)
are proud to honor

Dr. Thomas W. Williams

Senior technical staff member at IBM and Synopsys’ chief scientist and Synopsys fellow (retired)

with the
2018 Phil Kaufman Award

Dr. Williams is being honored for his overall impact on the electronics industry through contributions to scan Design for Testability and related test automation.


Dr. Williams is being honored with the 2018 Phil Kaufman Award for his outstanding contributions to test automation and his overall impact on the electronics industry. He was a key contributor to the development of test automation tools, including Level Sensitive Scan Design (LSSD) and subsequent enhancements to IC testing including adaptive scan. Dr. Williams has also been influential in the adoption of these techniques throughout the IC design industry with over 50 publications and 20 patents, thus enhancing the quality and value of today’s electronic products.

Additional information on Dr. William’s contributions in are available in the press release.

The ESD Alliance and the IEEE Council on EDA honored Dr. Williams with an award presentation and dinner on November 7, 2018 at The GlassHouse in San Jose, California.



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