Arm TechCon is the only comprehensive technology event that showcases the latest advances in Arm’s world-class architecture—from silicon design and software development to platform security and IoT solutions.
Join 4,000 like-minded engineers, architects, developers and product designers in an immersive, exciting three-day experience with Arm and its renowned ecosystem of leading companies in the embedded industry.
At Arm TechCon, you’ll improve your knowledge in embedded technology, be inspired by industry visionaries, learn about the latest Arm product releases and ecosystem developments, and connect with your peers and Arm technologists. In one convenient place, Arm TechCon will help you make possible the technology that will power the future.
Visit the ESD Alliance at Arm Techcon, October 16 – 18, 2018 at the San Jose Convention Center!
The ESD Alliance and IEEE-CEDA are proud to present the 2018 Phil Kaufman Award to Dr. Thomas W. Williams.
Dr. Williams is being honored for his outstanding contributions to test automation and his overall impact on the electronics industry. He was a key contributor to the development of test automation tools, including Level Sensitive Scan Design (LSSD) and subsequent enhancements to IC testing including adaptive scan. Dr. Williams has also been influential in the adoption of these techniques throughout the IC design industry with over 50 publications and 20 patents, thus enhancing the quality and value of today’s electronic products.
Join the ESD Alliance and IEEE-CEDA as we honor Dr. Williams, November 7, 2018, at the GlassHouse in San Jose, California.